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		No cover image available Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto. by Benso, Alfredo \| Prinetto, Paolo \| ProQuest (Firm). Series: Frontiers in electronic testing ; 23.Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2003Online access: Click to View Availability: No items available. Add to cart (remove)
		No cover image available Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto. by Benso, Alfredo \| Prinetto, Paolo \| ProQuest (Firm). Series: Frontiers in electronic testing ; 23.Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2003Online access: Click to View Availability: No items available. Add to cart (remove)
		No cover image available A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E \| ProQuest (Firm). Series: Frontiers in electronic testingMaterial type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2002Online access: Click to View Availability: No items available. Add to cart (remove)
		No cover image available A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E \| ProQuest (Firm). Series: Frontiers in electronic testingMaterial type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2002Online access: Click to View Availability: No items available. Add to cart (remove)
		No cover image available Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. by Nadeau-Dostie, Benoit \| ProQuest (Firm). Series: Frontiers in electronic testingMaterial type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic, c2000Online access: Click to View Availability: No items available. Add to cart (remove)
		No cover image available Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. by Nadeau-Dostie, Benoit \| ProQuest (Firm). Series: Frontiers in electronic testingMaterial type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic, c2000Online access: Click to View Availability: No items available. Add to cart (remove)