Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie.

Contributor(s): Nadeau-Dostie, Benoit | ProQuest (Firm)Material type: TextTextSeries: Frontiers in electronic testingPublication details: Boston : Kluwer Academic, c2000Description: xvii, 239 p. : illSubject(s): Integrated circuits -- Testing | Electronic apparatus and appliances -- TestingGenre/Form: Electronic books.DDC classification: 621.385 LOC classification: TK7874 | .D47497 2000Online resources: Click to View
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Includes bibliographical references.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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