Reliability and radiation effects in compound semiconductors [electronic resource] / Allan Johnston.

By: Johnston, AllanContributor(s): ProQuest (Firm)Material type: TextTextPublication details: Hackensack, N.J. : World Scientific, 2010Description: xii, 363 p. : illISBN: 9789814277112 (electronic bk.)Subject(s): Compound semiconductorsGenre/Form: Electronic books.LOC classification: QC611.8.C64 | J64 2010Online resources: Click to View
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Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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