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Reliability and radiation effects in compound semiconductors

Johnston, Allan.

Reliability and radiation effects in compound semiconductors [electronic resource] / Allan Johnston. - Hackensack, N.J. : World Scientific, 2010. - xii, 363 p. : ill.

Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

ISBN: 9789814277112 (electronic bk.)

Subjects--Topical Terms:
Compound semiconductors.

Index Terms--Genre/Form:
Electronic books.

LC Class. No.: QC611.8.C64 / J64 2010

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