Results
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Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim. by International Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China) | Yarlagadda, Prasad [editor.] | Kim, Yun-Hae [editor.]. Series: Applied mechanics and materials ; Volume 568-570.Material type:  Text; Format:
available online
 ; Literary form:
Not fiction
Publisher: Zurich, Switzerland : TTP, 2014Copyright date: 2014Other title: ICMIA 2014.Online access: Click to View Availability: No items available.
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Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim. by International Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China) | Yarlagadda, Prasad [editor.] | Kim, Yun-Hae [editor.]. Series: Applied mechanics and materials ; Volume 568-570.Material type: Text; Format:
available online
; Literary form:
Not fiction
Publisher: Zurich, Switzerland : TTP, 2014Copyright date: 2014Other title: ICMIA 2014.Online access: Click to View Availability: No items available.
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