Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim.
Material type:
TextSeries: Applied mechanics and materials ; Volume 568-570.Publisher: Zurich, Switzerland : TTP, 2014Copyright date: 2014Description: 1 online resource (2012 pages) : illustrations (some color), graphs, tablesContent type: text Media type: computer Carrier type: online resourceISBN: 9783038265214Other title: ICMIA 2014Subject(s): Detectors -- Congresses | Measurement -- Congresses | Measuring instruments -- CongressesGenre/Form: Electronic books.Additional physical formats: Print version:: Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China.DDC classification: 681.2 LOC classification: TA165 | .I584 2014Online resources: Click to View
Includes bibliographical references at the end of each chapters and indexes.
Description based on online resource; title from PDF title page (ebrary, viewed July 22, 2014).
Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
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