Atomic force microscopy [electronic resource] : exploring basic modes and advanced applications / Greg Haugstad.

By: Haugstad, Greg, 1963-Contributor(s): ProQuest (Firm)Material type: TextTextPublication details: Hoboken, N.J. : John Wiley & Sons, c2012Description: xxii, 464 p. : illISBN: 9781118360699 (electronic bk.)Subject(s): Atomic force microscopy | Scanning proble microscopyGenre/Form: Electronic books.DDC classification: 620/.5 LOC classification: QH212.A78 | H38 2012Online resources: Click to View
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Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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