Atomic force microscopy exploring basic modes and advanced applications /
Haugstad, Greg, 1963-
Atomic force microscopy exploring basic modes and advanced applications / [electronic resource] : Greg Haugstad. - Hoboken, N.J. : John Wiley & Sons, c2012. - xxii, 464 p. : ill.
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
9781118360699 (electronic bk.)
Atomic force microscopy.
Scanning proble microscopy.
Electronic books.
QH212.A78 / H38 2012
620/.5
Atomic force microscopy exploring basic modes and advanced applications / [electronic resource] : Greg Haugstad. - Hoboken, N.J. : John Wiley & Sons, c2012. - xxii, 464 p. : ill.
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
9781118360699 (electronic bk.)
Atomic force microscopy.
Scanning proble microscopy.
Electronic books.
QH212.A78 / H38 2012
620/.5