Electromigration in ULSI interconnections [electronic resource] / Cher Ming Tan.

By: Tan, Cher Ming, 1959-Contributor(s): ProQuest (Firm)Material type: TextTextSeries: International series on advances in solid state electronics and technologyPublication details: Hackensack, N.J. : World Scientific, c2010Description: xix, 291 p. : ill. (some col.), col. portISBN: 9789814273336 (electronic bk.)Subject(s): Integrated circuits -- Ultra large scale integration | ElectrodiffusionGenre/Form: Electronic books.LOC classification: TK7874.76 | .T36 2010Online resources: Click to View
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Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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