Electromigration in ULSI interconnections
Tan, Cher Ming, 1959-
Electromigration in ULSI interconnections [electronic resource] / Cher Ming Tan. - Hackensack, N.J. : World Scientific, c2010. - xix, 291 p. : ill. (some col.), col. port. - International series on advances in solid state electronics and technology (ASSET) . - International series on advances in solid state electronics and technology. .
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
9789814273336 (electronic bk.)
Integrated circuits--Ultra large scale integration.
Electrodiffusion.
Electronic books.
TK7874.76 / .T36 2010
Electromigration in ULSI interconnections [electronic resource] / Cher Ming Tan. - Hackensack, N.J. : World Scientific, c2010. - xix, 291 p. : ill. (some col.), col. port. - International series on advances in solid state electronics and technology (ASSET) . - International series on advances in solid state electronics and technology. .
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
9789814273336 (electronic bk.)
Integrated circuits--Ultra large scale integration.
Electrodiffusion.
Electronic books.
TK7874.76 / .T36 2010