ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman.

By: Voldman, Steven HContributor(s): ProQuest (Firm)Material type: TextTextPublication details: Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009Description: xxiv, 384 pOther title: Electrostatic dischargeSubject(s): Semiconductors -- Failures | Integrated circuits -- Protection | Integrated circuits -- Testing | Integrated circuits -- Reliability | Electric discharges | ElectrostaticsGenre/Form: Electronic books.DDC classification: 621.381 LOC classification: TK7871.852 | .V65 2009Online resources: Click to View
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Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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