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ESD failure mechanisms and models /

Voldman, Steven H.

ESD failure mechanisms and models / [electronic resource] : Electrostatic discharge Steven H. Voldman. - Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009. - xxiv, 384 p.

Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

ISBN:

LCCN:

Subjects--Topical Terms:
Semiconductors--Failures.
Integrated circuits--Protection.
Integrated circuits--Testing.
Integrated circuits--Reliability.
Electric discharges.
Electrostatics.

Index Terms--Genre/Form:
Electronic books.

LC Class. No.: TK7871.852 / .V65 2009

Dewey Class. No.: 621.381

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