Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.

By: Gray, Kirk [author.]Contributor(s): Paschkewitz, John James [author.]Material type: TextTextSeries: Wiley series in quality and reliability engineeringPublisher: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016Description: 1 online resource (299 pages) : illustrations (some color)Content type: text Media type: computer Carrier type: online resourceISBN: 9781118700204Subject(s): Accelerated life testing | Electronic systems -- Design and construction | Electronic systems -- TestingGenre/Form: Electronic books.Additional physical formats: Print version:: Next generation HALT and HASS : robust design of electronics and systems.DDC classification: 621.381028/7 LOC classification: TA169.3 | .G73 2016Online resources: Click to View
Contents:
Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Includes bibliographical references and index.

Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.

Description based on print version record.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

There are no comments on this title.

to post a comment.