Next generation HALT and HASS : robust design of electronics and systems /
Gray, Kirk,
Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz. - 1 online resource (299 pages) : illustrations (some color) - Wiley series in quality and reliability engineering . - Wiley series in quality and reliability engineering. .
Includes bibliographical references and index.
Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.
9781118700204
Accelerated life testing.
Electronic systems--Design and construction.
Electronic systems--Testing.
Electronic books.
TA169.3 / .G73 2016
621.381028/7
Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz. - 1 online resource (299 pages) : illustrations (some color) - Wiley series in quality and reliability engineering . - Wiley series in quality and reliability engineering. .
Includes bibliographical references and index.
Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.
9781118700204
Accelerated life testing.
Electronic systems--Design and construction.
Electronic systems--Testing.
Electronic books.
TA169.3 / .G73 2016
621.381028/7