Scanning force microscopy [electronic resource] : with applications to electric, magnetic, and atomic forces / Dror Sarid.

By: Sarid, DrorContributor(s): ProQuest (Firm)Material type: TextTextSeries: Oxford series in optical and imaging sciences ; 5.Publication details: New York : Oxford University Press, 1994Edition: Rev. edDescription: xiii, 263 p. : illSubject(s): Scanning force microscopy | Surfaces (Physics)Genre/Form: Electronic books.LOC classification: QH212.S32 | S27 1994Online resources: Click to View
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