Scanning force microscopy with applications to electric, magnetic, and atomic forces /
Sarid, Dror.
Scanning force microscopy with applications to electric, magnetic, and atomic forces / [electronic resource] : Dror Sarid. - Rev. ed. - New York : Oxford University Press, 1994. - xiii, 263 p. : ill. - Oxford series in optical and imaging sciences ; 5 . - Oxford series in optical and imaging sciences ; 5. .
Includes bibliographical references (p. 233-259) and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Scanning force microscopy.
Surfaces (Physics)
Electronic books.
QH212.S32 / S27 1994
Scanning force microscopy with applications to electric, magnetic, and atomic forces / [electronic resource] : Dror Sarid. - Rev. ed. - New York : Oxford University Press, 1994. - xiii, 263 p. : ill. - Oxford series in optical and imaging sciences ; 5 . - Oxford series in optical and imaging sciences ; 5. .
Includes bibliographical references (p. 233-259) and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Scanning force microscopy.
Surfaces (Physics)
Electronic books.
QH212.S32 / S27 1994