Electron microscopy and analysis [electronic resource] / Peter J. Goodhew, John Humphreys, Richard Beanland.

By: Goodhew, Peter JContributor(s): Beanland, R | Humphreys, F. J | ProQuest (Firm)Material type: TextTextPublication details: London : Taylor & Francis, 2001Edition: 3rd edDescription: xi, 251 p. : illSubject(s): Electron microscopyGenre/Form: Electronic books.DDC classification: 502.825 LOC classification: QH212.E4 | G62 2001Online resources: Click to View
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Previous ed.: 1988.

Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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