Electron microscopy and analysis
Goodhew, Peter J.
Electron microscopy and analysis [electronic resource] / Peter J. Goodhew, John Humphreys, Richard Beanland. - 3rd ed. - London : Taylor & Francis, 2001. - xi, 251 p. : ill.
Previous ed.: 1988.
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
GBA1-43398
0748409688 Uk
Electron microscopy.
Electronic books.
QH212.E4 / G62 2001
502.825
Electron microscopy and analysis [electronic resource] / Peter J. Goodhew, John Humphreys, Richard Beanland. - 3rd ed. - London : Taylor & Francis, 2001. - xi, 251 p. : ill.
Previous ed.: 1988.
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
GBA1-43398
0748409688 Uk
Electron microscopy.
Electronic books.
QH212.E4 / G62 2001
502.825