| 000 | 01367nam a2200373Ia 4500 | ||
|---|---|---|---|
| 001 | EBC894402 | ||
| 003 | MiAaPQ | ||
| 005 | 20240120133434.0 | ||
| 006 | m o d | | ||
| 007 | cr cn||||||||| | ||
| 008 | 120302s2012 njua sb 001 0 eng d | ||
| 010 | _z 2012003429 | ||
| 020 | _z9780470638828 | ||
| 020 | _a9781118360699 (electronic bk.) | ||
| 035 | _a(MiAaPQ)EBC894402 | ||
| 035 | _a(Au-PeEL)EBL894402 | ||
| 035 | _a(CaPaEBR)ebr10606048 | ||
| 035 | _a(CaONFJC)MIL395852 | ||
| 035 | _a(OCoLC)812067151 | ||
| 040 |
_aMiAaPQ _cMiAaPQ _dMiAaPQ |
||
| 050 | 4 |
_aQH212.A78 _bH38 2012 |
|
| 082 | 0 | 4 |
_a620/.5 _223 |
| 100 | 1 |
_aHaugstad, Greg, _d1963- |
|
| 245 | 1 | 0 |
_aAtomic force microscopy _h[electronic resource] : _bexploring basic modes and advanced applications / _cGreg Haugstad. |
| 260 |
_aHoboken, N.J. : _bJohn Wiley & Sons, _cc2012. |
||
| 300 |
_axxii, 464 p. : _bill. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 533 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | _aAtomic force microscopy. | |
| 650 | 0 | _aScanning proble microscopy. | |
| 655 | 4 | _aElectronic books. | |
| 710 | 2 | _aProQuest (Firm) | |
| 856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=894402 _zClick to View |
| 999 |
_c77554 _d77554 |
||