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001 EBC731150
003 MiAaPQ
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006 m o d |
007 cr cn|||||||||
008 110713s2011 si ad sb 001 0 eng d
020 _z9814324760
020 _z9789814324762
020 _a9789814324779 (electronic bk.)
035 _a(MiAaPQ)EBC731150
035 _a(Au-PeEL)EBL731150
035 _a(CaPaEBR)ebr10479780
035 _a(CaONFJC)MIL314515
035 _a(OCoLC)738438959
040 _aMiAaPQ
_cMiAaPQ
_dMiAaPQ
050 4 _aQH212.S33
_bS33 2011
245 0 0 _aScanning probe microscopy
_h[electronic resource] /
_ceditors, Nikodem Tomczak, Kuan Eng Johnson Goh.
260 _aSingapore ;
_aHackensack, N.J. :
_bWorld Scientific Pub. Co.,
_c2011.
300 _axiv, 261 p. :
_bill. (some col.)
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 _aScanning probe microscopy.
650 0 _aNanoelectronics.
655 4 _aElectronic books.
700 1 _aTomczak, Nikodem.
700 1 _aGoh, Kuan Eng Johnson.
710 2 _aProQuest (Firm)
856 4 0 _uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=731150
_zClick to View
999 _c66810
_d66810