000 | 01381nam a2200373 a 4500 | ||
---|---|---|---|
001 | EBC731150 | ||
003 | MiAaPQ | ||
005 | 20240120132642.0 | ||
006 | m o d | | ||
007 | cr cn||||||||| | ||
008 | 110713s2011 si ad sb 001 0 eng d | ||
020 | _z9814324760 | ||
020 | _z9789814324762 | ||
020 | _a9789814324779 (electronic bk.) | ||
035 | _a(MiAaPQ)EBC731150 | ||
035 | _a(Au-PeEL)EBL731150 | ||
035 | _a(CaPaEBR)ebr10479780 | ||
035 | _a(CaONFJC)MIL314515 | ||
035 | _a(OCoLC)738438959 | ||
040 |
_aMiAaPQ _cMiAaPQ _dMiAaPQ |
||
050 | 4 |
_aQH212.S33 _bS33 2011 |
|
245 | 0 | 0 |
_aScanning probe microscopy _h[electronic resource] / _ceditors, Nikodem Tomczak, Kuan Eng Johnson Goh. |
260 |
_aSingapore ; _aHackensack, N.J. : _bWorld Scientific Pub. Co., _c2011. |
||
300 |
_axiv, 261 p. : _bill. (some col.) |
||
504 | _aIncludes bibliographical references and index. | ||
533 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
650 | 0 | _aScanning probe microscopy. | |
650 | 0 | _aNanoelectronics. | |
655 | 4 | _aElectronic books. | |
700 | 1 | _aTomczak, Nikodem. | |
700 | 1 | _aGoh, Kuan Eng Johnson. | |
710 | 2 | _aProQuest (Firm) | |
856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=731150 _zClick to View |
999 |
_c66810 _d66810 |