| 000 | 01517nam a2200421Ia 4500 | ||
|---|---|---|---|
| 001 | EBC454456 | ||
| 003 | MiAaPQ | ||
| 005 | 20240120131150.0 | ||
| 006 | m o d | | ||
| 007 | cr cn||||||||| | ||
| 008 | 090423s2009 enk sb 001 0 eng d | ||
| 010 | _z 2009015206 | ||
| 020 | _z9780470511374 (cloth) | ||
| 035 | _a(MiAaPQ)EBC454456 | ||
| 035 | _a(Au-PeEL)EBL454456 | ||
| 035 | _a(CaPaEBR)ebr10317806 | ||
| 035 | _a(CaONFJC)MIL223713 | ||
| 035 | _a(OCoLC)609844472 | ||
| 040 |
_aMiAaPQ _cMiAaPQ _dMiAaPQ |
||
| 050 | 4 |
_aTK7871.852 _b.V65 2009 |
|
| 082 | 0 | 4 |
_a621.381 _222 |
| 100 | 1 | _aVoldman, Steven H. | |
| 245 | 1 | 0 |
_aESD _h[electronic resource] : _bfailure mechanisms and models / _cSteven H. Voldman. |
| 246 | 3 | _aElectrostatic discharge | |
| 260 |
_aChichester, West Sussex, U.K. ; _aHoboken, NJ : _bJ. Wiley, _c2009. |
||
| 300 | _axxiv, 384 p. | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 533 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 |
_aSemiconductors _xFailures. |
|
| 650 | 0 |
_aIntegrated circuits _xProtection. |
|
| 650 | 0 |
_aIntegrated circuits _xTesting. |
|
| 650 | 0 |
_aIntegrated circuits _xReliability. |
|
| 650 | 0 | _aElectric discharges. | |
| 650 | 0 | _aElectrostatics. | |
| 655 | 4 | _aElectronic books. | |
| 710 | 2 | _aProQuest (Firm) | |
| 856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=454456 _zClick to View |
| 999 |
_c44608 _d44608 |
||