000			02291nam a2200481Ia 4500
001			EBC296120
003			MiAaPQ
005			20240120130311.0
006			m o d |
007			cr cn|||||||||
008			050128s2004 njuaf sb 000 0 eng d
020			_z9812560254 (pbk.)
035			_a(MiAaPQ)EBC296120
035			_a(Au-PeEL)EBL296120
035			_a(CaPaEBR)ebr10174034
035			_a(CaONFJC)MIL189709
035			_a(OCoLC)476063490
040			_aMiAaPQ _cMiAaPQ _dMiAaPQ
050		4	_aN8790 _b.F35 2004
245	0	0	_aFakebusters II _h[electronic resource] : _bscientific detection of fakery in art and philately / _cedited by Richard J. Weiss and Duane Chartier.
246	3		_aScientific detection of fakery in art and philately
260			_aSingapore ; _aHackensack, N.J. : _bWorld Scientific, _cc2004.
300			_ax, 317 p. : _bill. (some col.).
490	1		_aSeries in popular science ; _vv. 4
500			_a"Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."
504			_aIncludes bibliographical references.
533			_aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650		0	_aArt _xForgeries _vCongresses.
650		0	_aArt _xRadiography _vCongresses.
650		0	_aArt _xExpertising _vCongresses.
650		0	_aExpertising, X-ray _vCongresses.
650		0	_aScience and the arts _vCongresses.
650		0	_aArt and science _vCongresses.
655		4	_aElectronic books.
700	1		_aWeiss, Richard J. _q(Richard Jerome), _d1923-
700	1		_aChartier, Duane R.
710	2		_aSociety of Photo-optical Instrumentation Engineers.
710	2		_aInternational Center for Art Intelligence.
710	2		_aPhilatelic Fakes Forgeries and Experts.
710	2		_aProQuest (Firm)
830		0	_aSeries in popular science ; _vv. 4.
856	4	0	_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=296120 _zClick to View
999			_c29647 _d29647