| 000 | 01627nam a2200409 i 4500 | ||
|---|---|---|---|
| 001 | EBC4983681 | ||
| 003 | MiAaPQ | ||
| 005 | 20240123173117.0 | ||
| 006 | m o d | | ||
| 007 | cr cnu|||||||| | ||
| 008 | 170918t20172008enk o 000 0 eng d | ||
| 020 | _z9781848215771 | ||
| 020 |
_a9781119008675 _q(electronic bk.) |
||
| 035 | _a(MiAaPQ)EBC4983681 | ||
| 035 | _a(Au-PeEL)EBL4983681 | ||
| 035 | _a(CaPaEBR)ebr11428596 | ||
| 035 | _a(CaONFJC)MIL1028221 | ||
| 035 | _a(OCoLC)1001287930 | ||
| 040 |
_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ |
||
| 050 | 4 |
_aT174.7 _b.J353 2017 |
|
| 082 | 0 |
_a620.5 _223 |
|
| 100 | 1 |
_aJalabert, Denis, _eauthor. |
|
| 245 | 1 | 0 |
_aSwift ion beam analysis in nanosciences / _cDenis Jalabert. |
| 264 | 1 |
_aLondon, [England] ; _aNew York : _bRoutledge, _c2017. |
|
| 264 | 4 | _c2008 | |
| 300 | _a1 online resource (285 pages) | ||
| 336 |
_atext _2rdacontent |
||
| 337 |
_acomputer _2rdamedia |
||
| 338 |
_aonline resource _2rdacarrier |
||
| 588 | _aDescription based on online resource; title from PDF title page (ebrary, viewed September 16, 2017). | ||
| 590 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | _aNanotechnology. | |
| 655 | 4 | _aElectronic books. | |
| 776 | 0 | 8 |
_iPrint version: _aJalabert,Denis. _tSwift ion beam analysis in nanosciences. _dLondon, [England] ; New York : Routledge, 2017 c2008 _h217 pages _z9781848215771 |
| 797 | 2 | _aProQuest (Firm) | |
| 856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=4983681 _zClick to View |
| 999 |
_c293926 _d293926 |
||