| 000 | 01754nam a2200421 i 4500 | ||
|---|---|---|---|
| 001 | EBC4939442 | ||
| 003 | MiAaPQ | ||
| 005 | 20240123173008.0 | ||
| 006 | m o d | | ||
| 007 | cr cnu|||||||| | ||
| 008 | 170830t20172017gw ob 001 0 eng d | ||
| 020 | _z9783527340910 | ||
| 020 |
_a9783527699797 _q(electronic bk.) |
||
| 035 | _a(MiAaPQ)EBC4939442 | ||
| 035 | _a(Au-PeEL)EBL4939442 | ||
| 035 | _a(CaPaEBR)ebr11422579 | ||
| 035 | _a(CaONFJC)MIL1026779 | ||
| 035 | _a(OCoLC)1001380043 | ||
| 040 |
_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ |
||
| 050 | 4 |
_aQH212.A78 _b.C663 2017 |
|
| 082 | 0 |
_a502.82 _223 |
|
| 245 | 0 | 0 |
_aConductive atomic force microscopy : _bapplications in nanomaterials / _cedited by Mario Lanza. |
| 264 | 1 |
_aWeinheim, Germany : _bWiley-VCH, _c2017. |
|
| 264 | 4 | _c2017 | |
| 300 | _a1 online resource (99 pages) | ||
| 336 |
_atext _2rdacontent |
||
| 337 |
_acomputer _2rdamedia |
||
| 338 |
_aonline resource _2rdacarrier |
||
| 504 | _aIncludes bibliographical references at the end of each chapters and index. | ||
| 588 | _aDescription based on online resource; title from PDF title page (ebrary, viewed August 30, 2017). | ||
| 590 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | _aAtomic force microscopy. | |
| 655 | 4 | _aElectronic books. | |
| 700 | 1 |
_aLanza, Mario, _eeditor. |
|
| 776 | 0 | 8 |
_iPrint version: _tConductive atomic force microscopy : applications in nanomaterials. _dWeinheim, Germany : Wiley-VCH, c2017 _happroximately 99 pages _z9783527340910 |
| 797 | 2 | _aProQuest (Firm) | |
| 856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=4939442 _zClick to View |
| 999 |
_c293214 _d293213 |
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