000 01644nam a2200409 i 4500
001 EBC4790655
003 MiAaPQ
005 20240121105817.0
006 m o d |
007 cr cnu||||||||
008 170214t20172017gw a ob 001 0 eng|d
020 _z9783527340392
020 _a9783527800292
_q(electronic bk.)
035 _a(MiAaPQ)EBC4790655
035 _a(Au-PeEL)EBL4790655
035 _a(CaPaEBR)ebr11333165
035 _a(CaONFJC)MIL989073
035 _a(OCoLC)970631721
040 _aMiAaPQ
_beng
_erda
_epn
_cMiAaPQ
_dMiAaPQ
050 4 _aT174.7
_b.M48 2017
245 0 0 _aMetrology and standardization for nanotechnology :
_bprotocols and industrial innovations /
_cedited by Elisabeth Mansfield [and three others].
264 1 _aWeinheim :
_bWiley-VCH,
_c[2017]
264 4 _c2017
300 _a1 online resource (629 pages) :
_billustrations (some color).
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
490 0 _aNanotechnology innovation & applications
504 _aIncludes bibliographical references and index.
588 _aDescription based on online resource; title from PDF title page (ebrary, viewed February 14, 2017).
590 _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 _aNanotechnology.
655 4 _aElectronic books.
700 1 _aMansfield, Elisabeth,
_eeditor.
797 2 _aProQuest (Firm)
856 4 0 _uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=4790655
_zClick to View
999 _c280161
_d280161