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001			EBC4769016
003			MiAaPQ
005			20240121104506.0
006			m o d |
007			cr cnu||||||||
008			161219t20162016gw a ob 001 0 eng d
020			_z9783110477016
020			_a9783110480153 _q(electronic bk.)
020			_a9783110479713 _q(electronic bk.)
035			_a(MiAaPQ)EBC4769016
035			_a(Au-PeEL)EBL4769016
035			_a(CaPaEBR)ebr11316799
035			_a(CaONFJC)MIL970170
035			_a(OCoLC)966490216
040			_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ
050		4	_aTA417.3 _b.H836 2016
082	0		_a620.11278 _223
100	1		_aHuang, Songling, _eauthor.
245	1	0	_aMagnetic flux leakage : _btheories and imaging technologies / _cSongling Huang, Wei Zhao.
264		1	_aBerlin, [Germany] ; _aBoston, [Massachusetts] : _bDe Gruyter, _c2016.
264		4	_c2016
300			_a1 online resource (242 pages) : _billustrations.
336			_atext _2rdacontent
337			_acomputer _2rdamedia
338			_aonline resource _2rdacarrier
490	1		_aAdvances in Electrical and Electronic Engineering, _x2509-582X ; _vVolume 1
504			_aIncludes bibliographical references and index.
588			_aDescription based on online resource; title from PDF title page (ebrary, viewed December 19, 2016).
590			_aElectronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650		0	_aMagnetic testing.
650		0	_aMagnetic flux.
655		4	_aElectronic books.
700	1		_aZhao, Wei, _eauthor.
776	0	8	_iPrint version: _aHuang, Songling. _tMagnetic flux leakage : theories and imaging technologies. _dBerlin, [Germany] ; Boston, [Massachusetts] : De Gruyter, c2016 _hix, 232 pages _kAdvances in electrical and electronic engineering ; Volume 1. _z9783110477016
797	2		_aProQuest (Firm)
830		0	_aAdvances in electrical and electronic engineering ; _vVolume 1.
856	4	0	_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=4769016 _zClick to View
999			_c277827 _d277827