| 000 | 02736nam a2200493 i 4500 | ||
|---|---|---|---|
| 001 | EBC4451897 | ||
| 003 | MiAaPQ | ||
| 005 | 20240123162013.0 | ||
| 006 | m o d | | ||
| 007 | cr cnu|||||||| | ||
| 008 | 151207s2016 enkad ob 001 0 eng|d | ||
| 020 | _z9781118700235 (cloth) | ||
| 020 | _z9781118700228 | ||
| 020 |
_a9781118700204 _q(electronic bk.) |
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| 035 | _a(MiAaPQ)EBC4451897 | ||
| 035 | _a(Au-PeEL)EBL4451897 | ||
| 035 | _a(CaPaEBR)ebr11172310 | ||
| 035 | _a(CaONFJC)MIL909295 | ||
| 035 | _a(OCoLC)933211556 | ||
| 040 |
_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ |
||
| 050 | 4 |
_aTA169.3 _b.G73 2016 |
|
| 082 | 0 |
_a621.381028/7 _223 |
|
| 100 | 1 |
_aGray, Kirk, _eauthor. |
|
| 245 | 1 | 0 |
_aNext generation HALT and HASS : _brobust design of electronics and systems / _cKirk Gray, John James Paschkewitz. |
| 264 | 1 |
_aChichester, West Sussex, United Kingdom ; _aHoboken, NJ : _bWiley, _c2016. |
|
| 300 |
_a1 online resource (299 pages) : _billustrations (some color) |
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| 336 |
_atext _2rdacontent |
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| 337 |
_acomputer _2rdamedia |
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| 338 |
_aonline resource _2rdacarrier |
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| 490 | 1 | _aWiley series in quality and reliability engineering | |
| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | _aBasis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods. | |
| 588 | _aDescription based on print version record. | ||
| 590 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | _aAccelerated life testing. | |
| 650 | 0 |
_aElectronic systems _xDesign and construction. |
|
| 650 | 0 |
_aElectronic systems _xTesting. |
|
| 655 | 4 | _aElectronic books. | |
| 700 | 1 |
_aPaschkewitz, John James, _eauthor. |
|
| 776 | 0 | 8 |
_iPrint version: _aGray, Kirk. _tNext generation HALT and HASS : robust design of electronics and systems. _dChichester, West Sussex, United Kingdom : Wiley, 2016 _kWiley series in quality and reliability engineering _z9781118700228 |
| 797 | 2 | _aProQuest (Firm) | |
| 830 | 0 | _aWiley series in quality and reliability engineering. | |
| 856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=4451897 _zClick to View |
| 999 |
_c251482 _d251482 |
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