000 | 01399nam a2200361Ia 4500 | ||
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001 | EBC241662 | ||
003 | MiAaPQ | ||
005 | 20240120125922.0 | ||
006 | m o d | | ||
007 | cr cn||||||||| | ||
008 | 940126s1994 nyua sb 001 0 eng d | ||
035 | _a(MiAaPQ)EBC241662 | ||
035 | _a(Au-PeEL)EBL241662 | ||
035 | _a(CaPaEBR)ebr10087124 | ||
035 | _a(CaONFJC)MIL44178 | ||
035 | _a(OCoLC)475957730 | ||
040 |
_aMiAaPQ _cMiAaPQ _dMiAaPQ |
||
050 | 4 |
_aQH212.S32 _bS27 1994 |
|
100 | 1 | _aSarid, Dror. | |
245 | 1 | 0 |
_aScanning force microscopy _h[electronic resource] : _bwith applications to electric, magnetic, and atomic forces / _cDror Sarid. |
250 | _aRev. ed. | ||
260 |
_aNew York : _bOxford University Press, _c1994. |
||
300 |
_axiii, 263 p. : _bill. |
||
490 | 1 |
_aOxford series in optical and imaging sciences ; _v5 |
|
504 | _aIncludes bibliographical references (p. 233-259) and index. | ||
533 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
650 | 0 | _aScanning force microscopy. | |
650 | 0 | _aSurfaces (Physics) | |
655 | 4 | _aElectronic books. | |
710 | 2 | _aProQuest (Firm) | |
830 | 0 |
_aOxford series in optical and imaging sciences ; _v5. |
|
856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=241662 _zClick to View |
999 |
_c22524 _d22524 |