000 01399nam a2200361Ia 4500
001 EBC241662
003 MiAaPQ
005 20240120125922.0
006 m o d |
007 cr cn|||||||||
008 940126s1994 nyua sb 001 0 eng d
035 _a(MiAaPQ)EBC241662
035 _a(Au-PeEL)EBL241662
035 _a(CaPaEBR)ebr10087124
035 _a(CaONFJC)MIL44178
035 _a(OCoLC)475957730
040 _aMiAaPQ
_cMiAaPQ
_dMiAaPQ
050 4 _aQH212.S32
_bS27 1994
100 1 _aSarid, Dror.
245 1 0 _aScanning force microscopy
_h[electronic resource] :
_bwith applications to electric, magnetic, and atomic forces /
_cDror Sarid.
250 _aRev. ed.
260 _aNew York :
_bOxford University Press,
_c1994.
300 _axiii, 263 p. :
_bill.
490 1 _aOxford series in optical and imaging sciences ;
_v5
504 _aIncludes bibliographical references (p. 233-259) and index.
533 _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 _aScanning force microscopy.
650 0 _aSurfaces (Physics)
655 4 _aElectronic books.
710 2 _aProQuest (Firm)
830 0 _aOxford series in optical and imaging sciences ;
_v5.
856 4 0 _uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=241662
_zClick to View
999 _c22524
_d22524