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| 008 | 990817s2000 maua sb 000 0 eng | ||
| 010 | _z 99046022 | ||
| 020 | _z0792386698 (alk. paper) | ||
| 035 | _a(MiAaPQ)EBC3035636 | ||
| 035 | _a(Au-PeEL)EBL3035636 | ||
| 035 | _a(CaPaEBR)ebr10052637 | ||
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_a621.385 _221 |
| 245 | 0 | 0 |
_aDesign for at-speed test, diagnosis, and measurement _h[electronic resource] / _cedited by Benoit Nadeau-Dostie. |
| 260 |
_aBoston : _bKluwer Academic, _cc2000. |
||
| 300 |
_axvii, 239 p. : _bill. |
||
| 490 | 1 | _aFrontiers in electronic testing | |
| 504 | _aIncludes bibliographical references. | ||
| 533 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 |
_aIntegrated circuits _xTesting. |
|
| 650 | 0 |
_aElectronic apparatus and appliances _xTesting. |
|
| 655 | 4 | _aElectronic books. | |
| 700 | 1 | _aNadeau-Dostie, Benoit. | |
| 710 | 2 | _aProQuest (Firm) | |
| 830 | 0 | _aFrontiers in electronic testing. | |
| 856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=3035636 _zClick to View |
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