000 01420nam a2200397Ia 4500
001 EBC3018760
003 MiAaPQ
005 20240121041619.0
006 m o d |
007 cr cn|||||||||
008 100408s2010 nyua sb 001 0 eng d
010 _z 2010012145
020 _z1616682515
020 _z9781611226874
020 _z9781616682514 (hc)
035 _a(MiAaPQ)EBC3018760
035 _a(Au-PeEL)EBL3018760
035 _a(CaPaEBR)ebr10661698
035 _a(OCoLC)839305357
040 _aMiAaPQ
_cMiAaPQ
_dMiAaPQ
050 4 _aQC589
_b.C48 2010
082 0 4 _a537/.2
_222
100 1 _aChubb, John.
245 1 3 _aAn introduction to electrostatic measurements
_h[electronic resource] /
_cJohn Chubb.
260 _aNew York :
_bNova Science Publishers,
_cc2010.
300 _axi, 216 p. :
_bill.
490 1 _aElectrical engineering developments
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 _aElectrostatics
_xMeasurement.
650 0 _aElectrostatic analyzers.
655 4 _aElectronic books.
710 2 _aProQuest (Firm)
830 0 _aElectrical engineering developments series.
856 4 0 _uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=3018760
_zClick to View
999 _c151912
_d151911