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| 008 | 010730s2001 enka sb 001 0 eng | ||
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| 015 | _aGBA1-43398 | ||
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_a0748409688 _2Uk |
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| 020 | _z0748409688(pbk.) | ||
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| 050 | 4 |
_aQH212.E4 _bG62 2001 |
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| 082 | 0 | 4 |
_a502.825 _221 |
| 100 | 1 | _aGoodhew, Peter J. | |
| 245 | 1 | 0 |
_aElectron microscopy and analysis _h[electronic resource] / _cPeter J. Goodhew, John Humphreys, Richard Beanland. |
| 250 | _a3rd ed. | ||
| 260 |
_aLondon : _bTaylor & Francis, _c2001. |
||
| 300 |
_axi, 251 p. : _bill. |
||
| 500 | _aPrevious ed.: 1988. | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 533 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | _aElectron microscopy. | |
| 655 | 4 | _aElectronic books. | |
| 700 | 1 | _aBeanland, R. | |
| 700 | 1 | _aHumphreys, F. J. | |
| 710 | 2 | _aProQuest (Firm) | |
| 856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=168520 _zClick to View |
| 999 |
_c14698 _d14698 |
||