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008 040213s2005 enka b 001 0 eng
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_eclaim2 2010-06-15
_eto CAD 2010-10-19
955 _apc10 2004-02-13 to ASCD
_ijp18 2004-02-17 to SL
_ejp14 2004-02-19 to Dewey
_aaa01 2004-02-20
_aCAD uf31 2006-10-26
_axe10 2010-12-10 1 copy rec'd., to CIP ver.
_frf15 2010-12-16 (telework) Z-CipVer
010 _a 2004044467
020 _a9780130430281 (pbk.)
020 _a0130430285 (pbk.)
035 _a(OCoLC)ocm54461950
040 _aDLC
_cDLC
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082 0 0 _a530.8
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084 _a50.21
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084 _aUX 1100
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084 _aZQ 3100
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100 1 _aBentley, John P.,
_d1943-
245 1 0 _aPrinciples of measurement systems /
_cJohn P. Bentley.
246 3 0 _aMeasurement systems
250 _a4th ed.
260 _aHarlow, England ;
_aNew York :
_bPearson Prentice Hall,
_c2005.
300 _axiv, 528 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index.
520 _a'Principles of Measurement Systems' treats measurement as a coherent and integrated subject. Looking at sensing, signal conditioning, signal processing, and data presentation, it offers a rounded discussion of the fundamentals of accurate measurement of all kinds of activity.
650 0 _aPhysical instruments.
650 0 _aPhysical measurements.
650 0 _aEngineering instruments.
650 0 _aAutomatic control.
999 _c12330
_d12330