000			02013nam a2200433 i 4500
001			EBC1872887
003			MiAaPQ
005			20240123070711.0
006			m o d |
007			cr cnu||||||||
008			130417t20122012sz o 000 0 eng d
020			_z9783037854426 (pbk.)
020			_a9783038138563 _q(electronic bk.)
035			_a(MiAaPQ)EBC1872887
035			_a(Au-PeEL)EBL1872887
035			_a(CaPaEBR)ebr10777688
035			_a(OCoLC)809121077
040			_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ
050		4	_aQC611.6.D4 _bI58 2011
111	2		_aInternational Conference on Defects: Recognition, Imaging and Physics in Semiconductors _n(14th : _d2011 : _cMiyazaki-shi, Japan)
245	1	0	_aDefects-recognition, imaging and physics in semiconductors XIV : _bselected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / _cedited by Hiroshi Yamada-Kaneta and Akira Sakai.
264		1	_aDurnten-Zurich ; _aEnfield, NH : _bTrans Tech Publications, _c[2012]
264		4	_c2012
300			_a1 online resource (300 pages).
336			_atext _2rdacontent
337			_acomputer _2rdamedia
338			_aonline resource _2rdacarrier
490	1		_aMaterials science forum ; _vvol. 725
588			_aDescription based on online resource; title from PDF title page (ebrary, viewed October 31, 2013).
590			_aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650		0	_aSemiconductors _xDefects _vCongresses.
650		0	_aPhysics _vCongresses.
655		4	_aElectronic books.
700	1		_aYamada-Kaneta, Hiroshi.
700	1		_aSakai, Akira _c(Professor of engineering science)
797	2		_aProQuest (Firm)
830		0	_aMaterials science forum ; _vv. 725.
856	4	0	_uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=1872887 _zClick to View
999			_c120872 _d120872