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001 EBC1611972
003 MiAaPQ
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006 m o d |
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008 140205t20142014njuad ob 000 0 eng|d
020 _z9789814571937
020 _a9789814571944
_q(electronic bk.)
035 _a(MiAaPQ)EBC1611972
035 _a(Au-PeEL)EBL1611972
035 _a(CaPaEBR)ebr10832740
035 _a(CaONFJC)MIL570900
035 _a(OCoLC)869522805
040 _aMiAaPQ
_beng
_erda
_epn
_cMiAaPQ
_dMiAaPQ
050 4 _aTA169
_b.R45 2014
245 0 0 _aReliability modeling with applications :
_bessays in honor of Professor Toshio Nakagawa on his 70th Birthday /
_ceditors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan.
264 1 _aNew Jersey :
_bWorld Scientific,
_c[2014]
264 4 _c2014
300 _a1 online resource (379 pages) :
_billustrations
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
504 _aIncludes bibliographical references.
588 _aDescription based on online resource; title from PDF title page (ebrary, viewed February 5, 2014).
590 _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 _aReliability (Engineering)
650 0 _aStochastic systems.
655 4 _aElectronic books.
700 1 _aNakamura, Syouji.
700 1 _aQian, Cun Hua.
700 1 _aChen, Mingchih.
797 2 _aProQuest (Firm)
856 4 0 _uhttps://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=1611972
_zClick to View
999 _c108569
_d108569