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Electron microscopy and analysis [electronic resource] / Peter J. Goodhew, John Humphreys, Richard Beanland.

by Goodhew, Peter J | Beanland, R | Humphreys, F. J | ProQuest (Firm).

Edition: 3rd ed.Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: London : Taylor & Francis, 2001Online access: Click to View Availability: No items available.

Characterization of high Tc materials and devices by electron microscopy [electronic resource] / edited by Nigel D. Browning, Stephen J. Pennycook.

by Browning, Nigel D | Pennycook, Stephen J | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Cambridge ; New York : Cambridge University Press, 2000Online access: Click to View Availability: No items available.

Strategies for two-dimensional crystallization of proteins using lipid monolayers [electronic resource] / Jens Dietrich, Catherine Venien-Bryan.

by Dietrich, Jens | Venien-Bryan, Catherine | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: London : Imperial College Press, c2005Online access: Click to View Availability: No items available.

High-resolution transmission electron microscopy and associated techniques / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring.

by Buseck, Peter [editor.] | Cowley, J. M. (John Maxwell), 1923- [editor.] | Eyring, LeRoy [editor.].

Material type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: New York, New York ; Oxford, [England] : Oxford University Press, 1988Copyright date: 1988Online access: Click to View Availability: No items available.

Three-dimensional electron microscopy of macromolecular assemblies [electronic resource] : visualization of biological molecules in their native state / Joachim Frank.

by Frank, J. (Joachim), 1940- | ProQuest (Firm).

Edition: 2nd ed.Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Oxford ; New York : Oxford University Press, 2006Online access: Click to View Availability: No items available.

Biomedical electron microscopy [electronic resource] : illustrated methods and interpretations / Arvid B. Maunsbach, Bjorn A. Afzelius.

by Maunsbach, Arvid Bernhard | Afzelius, Bjorn | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: San Diego, CA : Academic Press, c1999Online access: Click to View Availability: No items available.

Biological low-voltage scanning electron microscopy [electronic resource] / edited by Heide Schatten, James B. Pawley.

by Schatten, Heide | Pawley, James B | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: New York : Springer, c2008Online access: Click to View Availability: No items available.

Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) [electronic resource] / Debbie J. Stokes.

by Stokes, Debbie | Royal Microscopical Society (Great Britain) | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Chichester, U.K. : Wiley, 2008Online access: Click to View Availability: No items available.

Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy.

by Joy, David C, 1943- | ProQuest (Firm).

Series: Oxford series in optical and imaging sciences ; 9.Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: New York : Oxford University Press, 1995Online access: Click to View Availability: No items available.

High-resolution electron microscopy [electronic resource] / John C.H. Spence.

by Spence, John C. H | ProQuest (Firm).

Series: Monographs on the physics and chemistry of materialsMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: New York : Oxford University Press, 2009Online access: Click to View Availability: No items available.

Aberration-corrected analytical transmission electron microscopy [electronic resource] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks.

by Brydson, Rik | Brooks, Susan | Royal Microscopical Society (Great Britain) | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Hoboken, N.J. : Wiley, 2011Online access: Click to View Availability: No items available.

Scanning electron microscopy for the life sciences [electronic resource] / Heide Schatten.

by Schatten, Heide | ProQuest (Firm).

Series: Advances in microscopy and microanalysisMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Cambridge ; New York : Cambridge University Press, 2013Online access: Click to View Availability: No items available.

Low voltage electron microscopy [electronic resource] : principles and applications / edited by David C. Bell and Natasha Erdman.

by Bell, D. C. (David C.) | Erdman, Natasha | ProQuest (Firm).

Series: RMS-Wiley seriesMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Hoboken : John Wiley & Sons Inc., 2013Online access: Click to View Availability: No items available.

Transmission electron microscopy in micro-nanoelectronics [electronic resource] / edited by Alain Claverie.

by Claverie, A. (Alain) | ProQuest (Firm).

Series: Nanoscience and nanotechnology seriesMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Hoboken, N.J. : London : John Wiley &Sons, Inc., ; ISTE, 2013Online access: Click to View Availability: No items available.

Nanocharacterisation [electronic resource] / edited by Angus I. Kirkland and John L. Hutchison.

by Kirkland, Angus | Hutchison, John | ProQuest (Firm).

Series: RSC nanoscience & nanotechnologyMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Cambridge, UK : RSC Publishing, c2007Online access: Click to View Availability: No items available.

In-situ electron microscopy at high resolution [electronic resource] / editor, Florian Banhart.

by Banhart, Florian | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Hackensack, NJ : World Scientific, c2008Online access: Click to View Availability: No items available.

Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / Takeo Oku.

by Oku, Takeo [author.].

Material type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: Berlin, [Germany] ; Boston, [Massachusetts] : De Gruyter, 2014Copyright date: 2014Online access: Click to View Availability: No items available.

4D electron microscopy [electronic resource] : imaging in space and time / Ahmed H. Zewail, John M. Thomas.

by Zewail, Ahmed H | Thomas, J. M. (John Meurig) | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: London : Hackensack, NJ : Imperial College Press ; Distributed by World Scientific Pub., c2010Other title: Four dimensional electron microscopy.Online access: Click to View Availability: No items available.

In memory of Akira Tonomura : physicist and electron microscopist / editors, Kazuo Fujikawa, Yoshimasa A Ono.

by Fujikawa, K [editor.] | Ono, Yoshimasa A [editor.].

Material type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: Singapore : World Scientific, 2014Copyright date: 2014Online access: Click to View Availability: No items available.

Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland / edited by Danuta Stroz and Krystian Prusik.

by International Conference on Electron Microscopy (14th : 2011 : Wisa, Poland) [issuing body.] | Stroz, Danuta | Prusik, Krystian.

Series: Diffusion and defect dataPt. BSolid state phenomena ; volumes 186.Material type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: Durnten-Zurich, Switzerland ; Enfield, NH, USA : TTP, [2012]Copyright date: 2012Other title: Electron microscopy 14.Online access: Click to View Availability: No items available.

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