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Accelerated testing and validation [electronic resource] : testing, engineering, and management tools for lean development / by Alex Porter.

by Porter, Alex.

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Amsterdam ; London : Newnes, 2004Online access: Click to View Availability: No items available.

Accelerated reliability and durability testing technology [electronic resource] / Lev M. Klyatis.

by Klyatis, Lev M | ProQuest (Firm).

Series: Wiley series in systems engineering and managementMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Hoboken, N.J. : Wiley, c2012Online access: Click to View Availability: No items available.

Structural life assessment methods [electronic resource] / A.F. Liu.

by Liu, A. F | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 1998Other title: Life assessment methods.Online access: Click to View Availability: No items available.

Structural life assessment methods [electronic resource] / A.F. Liu.

by Liu, A. F | ProQuest (Firm).

Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 1998Other title: Life assessment methods.Online access: Click to View Availability: No items available.

HALT, HASS, and HASA explained : accelerated reliability techniques / Harry W. McLean.

by McLean, Harry W, 1946- [author.].

Edition: Revised edition.Material type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: Milwaukee, Wisconsin : ASQ Quality Press, 2009Online access: Click to View Availability: No items available.

HALT, HASS, and HASA explained : accelerated reliability techniques / Harry W. McLean.

by McLean, Harry W, 1946- [author.].

Edition: Revised edition.Material type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: Milwaukee, Wisconsin : ASQ Quality Press, 2009Online access: Click to View Availability: No items available.

Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.

by Gray, Kirk [author.] | Paschkewitz, John James [author.].

Series: Wiley series in quality and reliability engineeringMaterial type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016Online access: Click to View Availability: No items available.

Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.

by Gray, Kirk [author.] | Paschkewitz, John James [author.].

Series: Wiley series in quality and reliability engineeringMaterial type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016Online access: Click to View Availability: No items available.

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