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		No cover image available Advanced mathematical & computational tools in metrology VI [electronic resource] / editors, P. Ciarlini ... [et al.]. by Ciarlini, P \| ProQuest (Firm). Series: Series on advances in mathematics for applied sciences ; v. 66.Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Singapore ; River Edge, NJ : World Scientific, c2004Online access: Click to View Availability: No items available. Add to cart (remove)
		No cover image available Advanced mathematical & computational tools in metrology & testing VIII [electronic resource] / editors, F. Pavese ... [et al.]. by AMCTM VIII (2008 : Paris, France) \| Pavese, Franco \| ProQuest (Firm). Series: Series on advances in mathematics for applied sciences ; v. 78.Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Singapore ; Hackensack, NJ : World Scientific, c2009Other title: Advanced mathematical and computational tools in metrology and testing VIII \| AMCTM 8.Online access: Click to View Availability: No items available. Add to cart (remove)
		No cover image available Handbook of surface and nanometrology [electronic resource] / David J. Whitehouse. by Whitehouse, D. J. (David J.) \| Whitehouse, D. J. (David J.). Handbook of surface metrology \| ProQuest (Firm). Edition: 2nd ed.Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boca Raton, FL : CRC Press, c2011Online access: Click to View Availability: No items available. Add to cart (remove)
		Optical imaging and metrology [electronic resource] : advanced technologies / edited by Wolfgang Osten and Nadya Reingand. by Osten, Wolfgang \| Reingand, Nadya \| ProQuest (Firm). Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Weinheim, Germany : Wiley-VCH, 2012Online access: Click to View Availability: No items available. Add to cart (remove)
		Measurement and monitoring / Vytautis Giniotis and Anthony Hope. by Giniotis, Vytautas [author.] \| Hope, Anthony [author.]. Series: Automation and control engineeringMaterial type: Text; Format: available online ; Literary form: Not fiction Publisher: New York : Momentum Press, LLC, [2014]Copyright date: 2014Online access: Click to View Availability: No items available. Add to cart (remove)
		Metrology and theory of measurement / Valery A. Slaev, Anna G. Chunovkina, Leonid A. Mironovsky. by Chunovkina, Anna G \| Mironovskii, L. A. (Leonid Alekseevich) \| Slaev, Valery A. Series: De Gruyter studies in mathematical physics ; 20Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Berlin ; Boston : De Gruyter, [2013]Copyright date: 2013Online access: Click to View Availability: No items available. Add to cart (remove)
		Metrology and physical constants : proceedings of the International School of Physics "Enrico Fermi", course 185, Varenna on Lake Como, Villa Monastero, 17-27 July 2012 / Italian Physical Society ; director of the course A. M. Rossi ; edited by E. Bava and M. Kuhne = Metrologia e costanti fisiche : Rendiconti Della Scuola Internazionale Di Fisica "Enrico Fermi", CLXXXV Corso, Varenna Sul Lago Di Como, Villa Monastero, 17-27 Luglio 2012 / Societa Italiana Di Fisica ; direttori del corso A. M. Rossi ; a cura di E. Bava e M. Kuhne. by Societa italiana di fisica \| Rossi, A. M \| Bava E \| Kuhne M. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Amsterdam, Netherlands : IOS Press, 2013Copyright date: 2013Online access: Click to View Availability: No items available. Add to cart (remove)
		Terahertz metrology / Mira Naftaly, editor. by Naftaly, Mira [editor.]. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Boston ; London : Artech House, [2015]Copyright date: 2015Online access: Click to View Availability: No items available. Add to cart (remove)
		Terahertz metrology / Mira Naftaly, editor. by Naftaly, Mira [editor.]. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Boston ; London : Artech House, [2015]Copyright date: 2015Online access: Click to View Availability: No items available. Add to cart (remove)
		Quantum metrology : foundation of units and measurements. / Ernst O. Gobel and Uwe Siegner. by Gobel, Ernst O [author.] \| Siegner, Uwe [author.]. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Weinheim, Germany : Wiley-VCH, 2015Copyright date: 2015Online access: Click to View Availability: No items available. Add to cart (remove)
		Quantum metrology : foundation of units and measurements. / Ernst O. Gobel and Uwe Siegner. by Gobel, Ernst O [author.] \| Siegner, Uwe [author.]. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Weinheim, Germany : Wiley-VCH, 2015Copyright date: 2015Online access: Click to View Availability: No items available. Add to cart (remove)
		Reasoning in measurement / edited by Nicola Mossner and Alfred Nordmann. by Mossner, Nicola [editor.] \| Nordmann, Alfred, 1956- [editor.]. Series: History and philosophy of technoscience ; 9.Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Oxfordshire, [England] ; New York, New York : Routledge, 2017Copyright date: 2017Online access: Click to View Availability: No items available. Add to cart (remove)
		Reasoning in measurement / edited by Nicola Mossner and Alfred Nordmann. by Mossner, Nicola [editor.] \| Nordmann, Alfred, 1956- [editor.]. Series: History and philosophy of technoscience ; 9.Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Oxfordshire, [England] ; New York, New York : Routledge, 2017Copyright date: 2017Online access: Click to View Availability: No items available. Add to cart (remove)
		Production metrology / by Prof. Dr.-Ing. Tilo Pfei, RWTH Aachen. by Pfeifer, Tilo [author.]. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Munchen : Oldenbourg Verlag, [2002]Copyright date: 2002Online access: Click to View Availability: No items available. Add to cart (remove)
		Production metrology / by Prof. Dr.-Ing. Tilo Pfei, RWTH Aachen. by Pfeifer, Tilo [author.]. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Munchen : Oldenbourg Verlag, [2002]Copyright date: 2002Online access: Click to View Availability: No items available. Add to cart (remove)
		New Frontiers for Metrology : from Biology and Chemistry to Quantum and Data Science. by Milton, M. J. T \| Wiersma, D. S \| Williams, C. J. Series: Proceedings of the International School of Physics Enrico Fermi SeriesEdition: 1st ed.Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Amsterdam : IOS Press, Incorporated, 2021Copyright date: �2021Online access: Click to View Availability: No items available. Add to cart (remove)