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		No cover image available System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. by Wang, Laung-Terng \| Stroud, Charles E \| Touba, Nur A \| ProQuest (Firm). Series: Morgan Kaufmann series in systems on siliconMaterial type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008Online access: Click to View Availability: No items available. Add to cart (remove)
		No cover image available A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E \| ProQuest (Firm). Series: Frontiers in electronic testingMaterial type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2002Online access: Click to View Availability: No items available. Add to cart (remove)
		No cover image available A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E \| ProQuest (Firm). Series: Frontiers in electronic testingMaterial type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2002Online access: Click to View Availability: No items available. Add to cart (remove)

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