Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday / editors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan.

Contributor(s): Nakamura, Syouji | Qian, Cun Hua | Chen, MingchihMaterial type: TextTextPublisher: New Jersey : World Scientific, [2014]Copyright date: 2014Description: 1 online resource (379 pages) : illustrationsContent type: text Media type: computer Carrier type: online resourceISBN: 9789814571944Subject(s): Reliability (Engineering) | Stochastic systemsGenre/Form: Electronic books.LOC classification: TA169 | .R45 2014Online resources: Click to View
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Includes bibliographical references.

Description based on online resource; title from PDF title page (ebrary, viewed February 5, 2014).

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

There are no comments on this title.

to post a comment.