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Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday / editors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan. by Nakamura, Syouji | Qian, Cun Hua | Chen, Mingchih. Material type:  Text; Format:
available online
 ; Literary form:
Not fiction
Publisher: New Jersey : World Scientific, [2014]Copyright date: 2014Online access: Click to View Availability: No items available.
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