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Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.

by Gray, Kirk [author.] | Paschkewitz, John James [author.].

Series: Wiley series in quality and reliability engineeringMaterial type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016Online access: Click to View Availability: No items available.

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Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.

by Gray, Kirk [author.] | Paschkewitz, John James [author.].

Series: Wiley series in quality and reliability engineeringMaterial type: Text Text; Format: available online remote; Literary form: Not fiction Publisher: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016Online access: Click to View Availability: No items available.

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