Wong, Terence K. S. <br/><br/>
Semiconductor strain metrology  principles and applications /  [electronic resource] : 
Terence K.S. Wong. 
 - [Saif Zone, Sharjah, U.A.E] ;  Oak Park, IL :  Bentham Science,  [2012] 
 - 136 p. :  ill. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Design and construction--Materials.<br/>Compound semiconductors--Design and construction--Materials.<br/>Silicon-on-insulator technology.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7871.85  / .W65 2012