TY  - BOOK
AU  - Haugstad,Greg
ED  - ProQuest (Firm)
TI  - Atomic force microscopy: exploring basic modes and advanced applications 
AV  - QH212.A78 H38 2012
U1  - 620/.5 23
PY  - 2012///
CY  - Hoboken, N.J.
PB  - John Wiley & Sons
KW  - Atomic force microscopy
KW  - Scanning proble microscopy
KW  - Electronic books
N1  - Includes bibliographical references and index; Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=894402
ER  -