Haugstad, Greg,  1963- <br/><br/>
Atomic force microscopy  exploring basic modes and advanced applications /  [electronic resource] : 
Greg Haugstad. 
 - Hoboken, N.J. :  John Wiley & Sons,  c2012. 
 - xxii, 464 p. :  ill. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
<br/><br/><label>ISBN: </label>9781118360699 (electronic bk.) 
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy.<br/>Scanning proble microscopy.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QH212.A78  / H38 2012 
<br/><br/><label>Dewey Class. No.: </label>620/.5