TY  - BOOK
AU  - Johnston,Allan
ED  - ProQuest (Firm)
TI  - Reliability and radiation effects in compound semiconductors
AV  - QC611.8.C64 J64 2010
PY  - 2010///
CY  - Hackensack, N.J.
PB  - World Scientific
KW  - Compound semiconductors
KW  - Electronic books
N1  - Includes bibliographical references and index; Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=731279
ER  -