TY  - BOOK
AU  - Tan,Cher Ming
ED  - ProQuest (Firm)
TI  - Electromigration in ULSI interconnections
T2  - International series on advances in solid state electronics and technology (ASSET)
AV  - TK7874.76 .T36 2010
PY  - 2010///
CY  - Hackensack, N.J.
PB  - World Scientific
KW  - Integrated circuits
KW  - Ultra large scale integration
KW  - Electrodiffusion
KW  - Electronic books
N1  - Includes bibliographical references and index; Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=731200
ER  -