Scanning probe microscopy  [electronic resource] / 
editors, Nikodem Tomczak, Kuan Eng Johnson Goh. 
 - Singapore ;  Hackensack, N.J. :  World Scientific Pub. Co.,  2011. 
 - xiv, 261 p. :  ill. (some col.) 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
<br/><br/><label>ISBN: </label>9789814324779 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy.<br/>Nanoelectronics.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QH212.S33  / S33 2011