TY  - BOOK
AU  - Voldman,Steven H.
ED  - ProQuest (Firm)
TI  - ESD: failure mechanisms and models 
AV  - TK7871.852 .V65 2009
U1  - 621.381 22
PY  - 2009///
CY  - Chichester, West Sussex, U.K., Hoboken, NJ
PB  - J. Wiley
KW  - Semiconductors
KW  - Failures
KW  - Integrated circuits
KW  - Protection
KW  - Testing
KW  - Reliability
KW  - Electric discharges
KW  - Electrostatics
KW  - Electronic books
N1  - Includes bibliographical references and index; Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=454456
ER  -