Voldman, Steven H. <br/><br/>
ESD  failure mechanisms and models /  [electronic resource] : 
 Electrostatic discharge 
Steven H. Voldman. 
 - Chichester, West Sussex, U.K. ;  Hoboken, NJ :  J. Wiley,  2009. 
 - xxiv, 384 p. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Failures.<br/>Integrated circuits--Protection.<br/>Integrated circuits--Testing.<br/>Integrated circuits--Reliability.<br/>Electric discharges.<br/>Electrostatics.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7871.852  / .V65 2009 
<br/><br/><label>Dewey Class. No.: </label>621.381