TY  - BOOK
AU  - Hennen,Leonhard
AU  - Hahn,Julia
AU  - Ladikas,Miltos
AU  - Lindner,Ralf
AU  - Peissl,Walter
AU  - van Est,Rinie
TI  - Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance
SN  - 9783031106170
AV  - JF20-2112 
PY  - 2023///
CY  - Cham
PB  - Springer International Publishing AG
KW  - Electronic books
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=7174910
ER  -